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Richard Chater

Dr Richard Chater Instrumentation Research Fellow in the Department of Materials and his research areas include; Thin films, surfaces and interfaces, Research Techniques, Focused Ion Beam (FIB) Surface Analysis : Secondary Ion Mass Spectrometry (SIMS), Low energy Ion Scattering (LEIS) and Microscope-based White-light Interferometry

Office/location: 71

Phone: 020 7594 6740 (ext 46740)

Email: [email protected]

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