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Peter Petrov | London Centre for Nanotechnology

Dr Peter Petrov

ext: 8156
office:

Materials

Research: 

My research interest is in the new material issues for development of nano-scale thin films and devices: fabrication of functional oxides based nano-scale multilayered structures; advanced methods for examining their structure and testing their electrical properties, and their implementation into microwave devices. I am author of more than 50 scientific papers and inventor of four patent applications (two of them owned by Ericsson AB) which are now granted patents.

Recent research publications or news stories:

  • A. Kozyrev, M. Gaidukov, A. Gagarin, A. Altynnikov, V. Osadchy, A. Tumarkin, P. K. Petrov, and N. M. Alford
  • "Evaluation of the space charge trap energy levels in the ferroelectric films" J. Appl. Phys 106, 014108 2009
  • P.K. Petrov, Y. Pan, B. Zou and N.McN Alford "Dielectric constant and loss tangent of thin ferroelectric films at microwave frequencies - how accurately can we evaluate them?" Integrated Ferroelectrics, 97: 27-37, 2008
  • P.K. Petrov, V.R. Palkar, A.K. Tagantsev, H-I Chien, K. Prashanthi, A-K Axelsson, S Bhattacharya, and N.McN. Alford: "Dielectric properties characterization of La- and Dy-doped BiFeO3 thin films", J. Mater. Res., 22(8), pp. 2179-2184, 2007
  • K. Brinkman, Y. Wang, M. Cantoni, D. Su, N. Setter, and P.K. Petrov "Processing and properties of ferroelectric relaxor lead scandium tantalate Pb(Sc1/2Ta1/2)O3 thin films", J. Mater. Res., 22 (1), pp 217-232, 2007
  • T. Yamada, J. Petzelt, A. K. Tagantsev, S. Denisov, D. Noujni, P. K. Petrov, A. Mackova, K. Fujito, T. Kiguchi,, K. Shinozaki, N. Mizutani, V. O. Sherman, P. Muralt, and N. Setter "In-Plane and Out-of-Plane Ferroelectric Instabilities in Epitaxial SrTiO3 Films", Phys. Rev. Lett. 96, 157602 (2006)

Facilities in research group.

Deposition Systems:

  • Pulsed Laser Deposition System
  • DC-RF magnetron sputtering, (coming soon)
  • E-beam evaporation(coming soon)
  • Spinner - Suss MicroTec Delta+6RC

Patterning:

  • Mask-Aligner Karl Suss MBJ3
  • Ion Milling System

Electrical Measurements and testing:

  • Microwave Cryo- (77K - 500K) probe-station with possibility for magnetic field biasing (up to 0.15 T) in both horizontal and vertical directions.
  • RT Microwave probe-station
  • 2 close cycle cryo-coolers (down to 7K)
  • 3 Agilent PNA (up to 40 GHz)
  • Agilent B1500 Semiconductor Analyzer (with 1 fA resolution)
  • Agilent RF LCR meter (up to 3 GHz)
  • Teraview THz spectrometer (100 GHz up to 4 THz)